In a few technology generations, limitations of fabrication processes will make accurate design time power estimates a daunting challenge. Static leakage current which comprises a significant fraction of total power due to large on-chip caches, is exponentially dependent on widely varying physical p
โฆ LIBER โฆ
[ACM Press the 2006 international symposium - Tegernsee, Bavaria, Germany (2006.10.04-2006.10.06)] Proceedings of the 2006 international symposium on Low power electronics and design - ISLPED '06 - Process variation aware cache leakage management
โ Scribed by Meng, Ke; Joseph, Russ
- Book ID
- 121313552
- Publisher
- ACM Press
- Year
- 2006
- Weight
- 510 KB
- Category
- Article
- ISBN-13
- 9781595934628
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