[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Soft error derating computation in sequential circuits

[ACM Press the 2006 IEEE/ACM internation

✍ Asadi, Hossein; Tahoori, Mehdi B. 📂 Article 📅 2006 🏛 ACM Press 🌐 English ⚖ 176 KB

Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), the probability of system failure due to soft errors, is a key factor in design of cost-effective soft error resilient sy

[ACM Press the 2006 IEEE/ACM internation

[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Verification through the principle of least astonishment

✍ Isaksen, Beth; Bertacco, Valeria 📂 Article 📅 2006 🏛 ACM Press 🌐 English ⚖ 319 KB

[ACM Press the 2006 IEEE/ACM internation

[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Verification through the principle of least astonishment

✍ Isaksen, Beth; Bertacco, Valeria 📂 Article 📅 2006 🏛 ACM Press 🌐 English ⚖ 319 KB

Assessing the correctness of a digital design is a challenging task hampered by extremely large circuit netlists, counterintuitive property descriptions and ill-defined specifications.In this paper we propose a new verification methodology, inspired by the principle of least astonishment. The underl

[ACM Press the 2006 IEEE/ACM internation

[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Application-independent defect-tolerant crossbar nano-architectures

✍ Tahoori, Mehdi B. 📂 Article 📅 2006 🏛 ACM Press 🌐 English ⚖ 157 KB

[ACM Press the 2006 IEEE/ACM internation

[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Design and CAD challenges in 45nm CMOS and beyond

✍ Frank, David J.; Puri, Ruchir; Toma, Dorel 📂 Article 📅 2006 🏛 ACM Press 🌐 English ⚖ 221 KB

[ACM Press the 2006 IEEE/ACM internation

[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits

✍ Choi, Jung Hwan; Bansal, Aditya; Meterelliyoz, Mesut; Murthy, Jayathi; Roy, Kaus 📂 Article 📅 2006 🏛 ACM Press 🌐 English ⚖ 269 KB