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[ACM Press the 2005 conference - Shanghai, China (2005.01.18-2005.01.21)] Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC '05 - Towards automatic parameter extraction for surface-potential-based MOSFET models with the genetic algorithm

✍ Scribed by Murakawa, Masahiro; Miura-Mattausch, Mitiko; Higuchi, Tetsuya


Book ID
118172971
Publisher
ACM Press
Year
2005
Tongue
English
Weight
204 KB
Volume
0
Category
Article
ISBN-13
9780780387379

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Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults that are untestable in the functional mode while testable in the test mode. This paper presents a pseudo-functional test m