Program Co-chairs, Leif Kobbelt, Vadim Shapiro ; Symposium Co-chairs, Ralph Martin, Jarek Rossignac ; Sponsored By Acm Siggraph. Symposium Was Part Of The 2005 Joint Convention On Solids And Shapes, Held At Massachusetts Institute Of Technology, Cambridge, Massachusetts, June 13-17, 2005. Acm Order
[ACM Press the 2005 ACM symposium - Cambridge, Massachusetts (2005.06.13-2005.06.15)] Proceedings of the 2005 ACM symposium on Solid and physical modeling - SPM '05 - Fast and robust detection of crest lines on meshes
โ Scribed by Yoshizawa, Shin; Belyaev, Alexander; Seidel, Hans-Peter
- Book ID
- 125435968
- Publisher
- ACM Press
- Year
- 2005
- Tongue
- English
- Weight
- 579 KB
- Category
- Article
- ISBN-13
- 9781595930156
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โฆ Synopsis
Program Co-chairs, Leif Kobbelt, Vadim Shapiro ; Symposium Co-chairs, Ralph Martin, Jarek Rossignac ; Sponsored By Acm Siggraph. Symposium Was Part Of The 2005 Joint Convention On Solids And Shapes, Held At Massachusetts Institute Of Technology, Cambridge, Massachusetts, June 13-17, 2005. Acm Order Number 433059--p. 2. Includes Bibliographical References And Author Index. Also Issued Online With Additional Title: Proceedings Of The 2005 Acm Symposium On Solid And Physical Modeling.
๐ SIMILAR VOLUMES
Program Co-chairs, Leif Kobbelt, Vadim Shapiro ; Symposium Co-chairs, Ralph Martin, Jarek Rossignac ; Sponsored By Acm Siggraph. Symposium Was Part Of The 2005 Joint Convention On Solids And Shapes, Held At Massachusetts Institute Of Technology, Cambridge, Massachusetts, June 13-17, 2005. Acm Order
This paper introduces a method to extract fingerprints of any surface or solid object by taking the eigenvalues of its respective Laplace-Beltrami operator. Using an object's spectrum (i.e. the family of its eigenvalues) as a fingerprint for its shape is motivated by the fact that the related eigenv
Sponsored By Acm Sigsac. Acm Order Number 537052--p. Ii. Includes Bibliographical References And Author Index. Also Issued Online With Additional Title: Proceedings Of The Tenth Acm Symposium On Access Control Models And Technologies.