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[ACM Press the 14th ACM/IEEE international symposium - San Fancisco, CA, USA (2009.08.19-2009.08.21)] Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design - ISLPED '09 - NBTI-aware power gating for concurrent leakage and aging optimization

✍ Scribed by Calimera, Andrea; Macii, Enrico; Poncino, Massimo


Book ID
120988916
Publisher
ACM Press
Year
2009
Weight
360 KB
Category
Article
ISBN
1605586846

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[ACM Press the 14th ACM/IEEE internation
✍ Calimera, Andrea; Macii, Enrico; Poncino, Massimo πŸ“‚ Article πŸ“… 2009 πŸ› ACM Press βš– 360 KB

Power and reliability are known to be intrinsically conflicting metrics: traditional solutions to improve reliability such as redundancy, increase of voltage levels, and up-sizing of critical devices do contrast with traditional low-power solutions, which rely on small devices and scaled supply volt