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[ACM Press the 13th ACM SIGKDD international conference - San Jose, California, USA (2007.08.12-2007.08.15)] Proceedings of the 13th ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '07 - Fast best-effort pattern matching in large attributed graphs

โœ Scribed by Tong, Hanghang; Faloutsos, Christos; Gallagher, Brian; Eliassi-Rad, Tina


Book ID
120573628
Publisher
ACM Press
Year
2007
Weight
816 KB
Category
Article
ISBN
1595936092

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