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[ACM Press Proceeding of the 33rd international conference - Waikiki, Honolulu, HI, USA (2011.05.21-2011.05.28)] Proceeding of the 33rd international conference on Software engineering - ICSE '11 - Detecting software modularity violations

โœ Scribed by Wong, Sunny; Cai, Yuanfang; Kim, Miryung; Dalton, Michael


Book ID
120986121
Publisher
ACM Press
Year
2011
Tongue
English
Weight
570 KB
Category
Article
ISBN
1450304451

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โœฆ Synopsis


This paper presents Clio, an approach that detects modularity violations, which can cause software defects, modularity decay, or expensive refactorings. Clio computes the discrepancies between how components should change together based on the modular structure, and how components actually change together as revealed in version history. We evaluated Clio using 15 releases of Hadoop Common and 10 releases of Eclipse JDT. The results show that hundreds of violations identified using Clio were indeed recognized as design problems or refactored by the developers in later versions. The identified violations exhibit multiple symptoms of poor design, some of which are not easily detectable using existing approaches.


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