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[ACM 33rd Design Automation Conference - Las Vegas, NV, USA (3-7 June 1996)] 33rd Design Automation Conference Proceedings, 1996 - A sparse image method for BEM capacitance extraction

✍ Scribed by Krauter, B.; Yu Xia, ; Dengi, A.; Pileggi, L.T.

Book ID: 121088159
Publisher: ACM
Year: 1996
Weight: 661 KB
Category: Article
ISBN-13: 9780897917797
DOI: 10.1109/DAC.1996.545601

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