Achievable key rates for universal simulation of random data with respect to a set of statistical tests

✍ Scribed by Merhav, N.

• Book ID: 114637506
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 294 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9448
• DOI: 10.1109/tit.2003.821994