Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal

✍ Scribed by Jin, L.; Parthasarathy, K.; Kuyel, T.; Degang Chen; Geiger, R.L.

• Book ID: 114629897
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 369 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2005.847240