Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling

✍ Scribed by Raskin, J.-P.; Gillon, R.; Jian Chen; Vanhoenacker-Janvier, D.; Colinge, J.-P.

• Book ID: 114537258
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 313 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.669514