Accurate quasi-TEM spectral domain analysis of single and multiple coupled microstrip lines of arbitrary metallization thickness

✍ Scribed by Jen-Tsai Kuo

• Book ID: 114552371
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 766 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/22.402277