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Accurate quantification of the Purcell effect in the presence of a dielectric microdisk of nanoscale thickness

โœ Scribed by Balaban, M.V.; Sauleau, R.; Benson, T.M.; Nosich, A.I.


Book ID
114461615
Publisher
The Institution of Engineering and Technology
Year
2011
Tongue
English
Weight
405 KB
Volume
6
Category
Article
ISSN
1750-0443

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