Accurate Measurement of Fault Currents Contaminated With Decaying DC Offset and CT Saturation

✍ Scribed by Hooshyar, A.; Sanaye-Pasand, M.

• Book ID: 115535165
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 783 KB
• Volume: 27
• Category: Article
• ISSN: 0885-8977
• DOI: 10.1109/tpwrd.2011.2176965