Accurate measurement of composition, carrier concentration, and photoconductive lifetime in Hg1−xCdxTe grown by molecular beam epitaxy

✍ Scribed by C. H. Swartz; S. Chandril; R. P. Tompkins; N. C. Giles; T. H. Myers; D. D. Edwall; E. C. Piquette; C. S. Kim; I. Vurgaftman; J. R. Meyer

• Publisher: Springer US
• Year: 2006
• Tongue: English
• Weight: 389 KB
• Volume: 35
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-006-0269-8