Accurate measurement of capture cross sections in deep level transient spectroscopy: Application to EL2 in GaAs

✍ Scribed by D. C. Look; Z. -Q. Fang; J. R. Sizelove

• Book ID: 112815010
• Publisher: Springer US
• Year: 1995
• Tongue: English
• Weight: 313 KB
• Volume: 24
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/bf02655464