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Accurate extraction of reverse leakage current components of shallow silicided p+-n junction for quarter- and sub-quarter-micron MOSFET's

✍ Scribed by Hi-Deok Lee; Jeong-Mo Hwang


Book ID
114537405
Publisher
IEEE
Year
1998
Tongue
English
Weight
89 KB
Volume
45
Category
Article
ISSN
0018-9383

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