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Accurate evaluation of subband structure in a carrier accumulation layer at an n-type InAs surface: LDF calculation combined with high-resolution photoelectron spectroscopy

✍ Scribed by Inaoka, Takeshi; Sanuki, Yoshihito; Shoji, Masahiro


Book ID
121407400
Publisher
American Institute of Physics
Year
2012
Tongue
English
Weight
877 KB
Volume
2
Category
Article
ISSN
2158-3226

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