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Accurate evaluation of mobility in high gate-leakage-current MOSFETs by using a transmission-line model

✍ Scribed by Tonomura, O.; Shimamoto, Y.; Miki, H.; Saito, S.-I.; Torii, K.; Hiratani, M.; Yugami, J.

Book ID
118698605
Publisher
IEEE
Year
2004
Tongue
English
Weight
385 KB
Volume
51
Category
Article
ISSN
0018-9383

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## Abstract This research and tutorial paper is the second part of a work dedicated to the analysis and computation of the electromagnetic behavior of inductor windings operating at high‐frequency regimes—a critical issue for very fast transient overvoltage studies. The inductor winding, wound arou