✦ LIBER ✦
Accurate evaluation of interface state density in SiC metal-oxide-semiconductor structures using surface potential based on depletion capacitance
✍ Scribed by Yoshioka, Hironori; Nakamura, Takashi; Kimoto, Tsunenobu
- Book ID
- 121277854
- Publisher
- American Institute of Physics
- Year
- 2012
- Tongue
- English
- Weight
- 669 KB
- Volume
- 111
- Category
- Article
- ISSN
- 0021-8979
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