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Accurate electrostatic and van der Waals pull-in prediction for fully clamped nano/micro-beams using linear universal graphs of pull-in instability

✍ Scribed by Tahani, Masoud; Askari, Amir R.


Book ID
124141329
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
618 KB
Volume
63
Category
Article
ISSN
1386-9477

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