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Accurate characterization of low-Q microwave resonator using critical-points method

✍ Scribed by Peng Wang; Lye Heng Chua; Mirshekar-Syahkal, D.

Book ID
114660178
Publisher
IEEE
Year
2005
Tongue
English
Weight
326 KB
Volume
53
Category
Article
ISSN
0018-9480

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## Abstract Experimental characterization of the dielectric properties of a SrTiO~3~ (__STO__) thin film in the microwave frequency range at room temperature is presented. The coplanar waveguide linear resonator technique, which is already well‐established for thick film characterization, was tailo