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Accurate analytical modelling of cosmic ray induced failure rates of power semiconductor devices

✍ Scribed by Friedhelm D. Bauer

Book ID: 108271731
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 459 KB
Volume: 53
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2009.03.025

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