✦ LIBER ✦
Accuracy in X-ray rocking-curve analysis as a necessary requirement for revealing vacancies and interstitials in regrown silicon layers amorphized by ion implantation
✍ Scribed by Servidori, M. ;Cembali, F.
- Book ID
- 114499949
- Publisher
- International Union of Crystallography
- Year
- 1988
- Tongue
- English
- Weight
- 649 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0021-8898
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