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Accuracy in surface profile measurement by x-ray methods

โœ Scribed by N. P. Valuev; F. L. Gerchikov; V. D. Kosarev; V. K. Latyshev; Yu. V. Moish; Yu. O. Yakubovskii-Lipskii


Publisher
Springer US
Year
1986
Tongue
English
Weight
348 KB
Volume
29
Category
Article
ISSN
0543-1972

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