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Accuracy in Single-Crystal X-Ray Diffractometry: Influence of Atmospheric Pressure, Scan Mode and Crystal Settlement on Intensity Profiles

โœ Scribed by A. T. H. Lenstra; M. Verbruggen; B. Bracke; B. van Dijk; C. Vanhulle; F. Vanhouteghem


Publisher
Wiley (John Wiley & Sons)
Year
2010
Weight
326 KB
Volume
101
Category
Article
ISSN
0037-9646

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Accuracy in Single-Crystal X-ray Diffrac
โœ M. Verbruggen; A. T. H. Lenstra ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› Wiley (John Wiley & Sons) โš– 393 KB

Software t e s t s checklng the d i f f r a c t a n e t e r s t a b l l l t y and the correctness o f instrument s e t t l n g s are developed. scan angle can be detected and t h e i r e f f e c t on the background corrected w i t h the help o f allaz s p l i t t l n g s . Mechanical i n s t a b i l