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Accuracy and reliability of thermal threshold measurement in the chin using heat flux technique

✍ Scribed by Teppei Kawano; Yuhji Kabasawa; Suga Ashikawa; Yuriko Sato; Shigeharu Jinno; Ken Omura

Book ID: 116942615
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 470 KB
Volume: 108
Category: Article
ISSN: 1528-395X
DOI: 10.1016/j.tripleo.2009.05.034

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