Application of an STM/SEM instrument for
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J. M. Gómez-Rodríguez; L. Vázquez; A. M. Baró
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Article
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1990
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John Wiley and Sons
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English
⚖ 821 KB
## Abstract We have used scanning tunnelling microscopy (STM) to study the surface topography of several materials in the nanometre range. In order to solve some problems of STM, we have integrated it with a conventional scanning electron microscopy (SEM). The aim of this paper is to analyse critic