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Accelerated testing of class A CMOS integrated circuits : B. Maximow, E. M. Reiss and S. Kukunaris. 15th A. Proc. Reliab. Phys. IEEE (1977) Nevada. p. 212


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
121 KB
Volume
17
Category
Article
ISSN
0026-2714

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