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Accelerated stress testing of a-Si:H pixel circuits for AMOLED displays

✍ Scribed by Sakariya, K.; Ng, C.K.M.; Servati, P.; Nathan, A.

Book ID: 114618026
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 670 KB
Volume: 52
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2005.859635

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