𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Accelerated reliability evaluation of trimetal integrated circuit chips in plastic packages : Larry J. Gallace, Lewis A. Jacobus, E. J. Pfiffner and Charles A. West. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-2, (2) 172 (June 1979)


Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
93 KB
Volume
20
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.