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Accelerated quasi-DC method and circuit for measuring the gate-drain coupling capacitance for devices within a CMOS process technology

✍ Scribed by Manku, T.; Singh, G.


Book ID
114447539
Publisher
The Institution of Electrical Engineers
Year
1996
Tongue
English
Weight
687 KB
Volume
143
Category
Article
ISSN
1350-2409

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