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Accelerated lifetesting and failure modes of thin film W contacts on SiGe Thermoelectric alloys : J. N. Sweet. Proc. IEEE Reliab. Physics Symp. April 2–4, 1974. p. 196


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
125 KB
Volume
14
Category
Article
ISSN
0026-2714

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