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Lucent Technologies performs accelerated life testing (ALT) for critical hardware sub-assemblies used in telecommunication systems. Critical hardware includes power amplifiers, radio units, and other sub-assemblies that have a strong impact on system reliability. ALT is used to evaluate potential pr
Multi-level accelerated life tests (ALTs), MEOST (multiple extreme overstress testing) and traditional step-stress approaches (hereafter all called simply step-stress) have a number of worthwhile applications for the analysis of the projected reliability of components and systems. These test methods
In this paper we are presenting a new approach which was developed for the accelerated tests of cryocoolers with a lifetime of 5Β± 20 yr. In accordance with this approach the cryocooler is separated into critical units, each of which is tested under its own unique program. After completion of tests a