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Accelerated life test of high power white light emitting diodes based on package failure mechanisms

โœ Scribed by S.I. Chan; W.S. Hong; K.T. Kim; Y.G. Yoon; J.H. Han; J.S. Jang

Book ID
113800558
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
578 KB
Volume
51
Category
Article
ISSN
0026-2714

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