✦ LIBER ✦
Accelerated dielectric breakdown and wear out standard testing methods and structures for reliability evaluation of thin oxides
✍ Scribed by G Ghibaudo; G Pananakakis; R Kies; E Vincent; C Papadas
- Book ID
- 108362415
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 280 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0026-2714
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