✦ LIBER ✦
Accelerated aging and long-term reliability study of ion-implanted GaAs MMIC IF amplifier
✍ Scribed by Esfandiari, R.; O'Neill, T.J.; Lin, T.S.; Kono, R.K.
- Book ID
- 114536561
- Publisher
- IEEE
- Year
- 1990
- Tongue
- English
- Weight
- 334 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0018-9383
- DOI
- 10.1109/16.52461
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