Thin porous silicon (PS) films were prepared by HF/HNO 3 vapor etching on silicon wafers. The infiltration of metallic cations inside the porous silicon matrix followed by slow heating in air leads to an interesting electrical and optical physical phenomena. Al 3+ , Cu + , K + , Li + metallic cation
AC impedance analysis of Au/porous silicon contacts
✍ Scribed by F. Fonthal; T. Trifonov; A. Rodriguez; L.F. Marsal; J. Pallarès
- Book ID
- 104051571
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 333 KB
- Volume
- 83
- Category
- Article
- ISSN
- 0167-9317
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✦ Synopsis
In this paper we present the AC impedance analysis of Au/porous silicon contacts in order to investigate their conduction mechanisms. The porous silicon layer was obtained by electrochemical etching of the p-Si wafer. The measurements were made between 5 Hz and 10 MHz, at room temperature and in the DC range from 0 to 2 V. An electrical equivalent circuit was used to fit the experimental data. The voltage dependence of the fitting parameters led to a deeper understanding of the physical parameters that limit the conduction mechanisms of the Au/PS contacts.
📜 SIMILAR VOLUMES
Complex impedance analysis of a new rare earth-based ceramic oxide, LaLiMo 2 O 8 , prepared by a standard solidstate reaction technique has been carried out. Material formation under the reported conditions has been confirmed by X-ray diffraction studies. A preliminary structural analysis indicates