Absolute thermal expansion measurements of single-crystal silicon in the range 300–1300 K with an interferometric dilatometer

Measurements of linear thermal expansion

Measurements of linear thermal expansion coefficients of copper SRM 736 and some commercially available coppers in the temperature range 20–300 K by means of an absolute interferometric dilatometer

✍ M. Okaji; N. Yamada; H. Kato; K. Nara 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 546 KB

The thermal expansivities of several grades of copper were measured in the temperature range 20-300 K by means of an absolute laser interferometric dilatometer. The present results for copper standard reference material (NIST; SRM 736) and three commercially available kinds of copper, such as a high