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Absolute Determination of Characteristic X-Ray Yields with a Wavelength-Dispersive Spectrometer

✍ Scribed by Merlet, Claude ;Llovet, Xavier

Book ID: 106196717
Publisher: Springer-Verlag
Year: 2006
Weight: 261 KB
Volume: 155
Category: Article
ISSN: 0344-838X
DOI: 10.1007/s00604-006-0543-8

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