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About the origin of the 0.15 to 0.20 eV defect level in cadmium telluride

โœ Scribed by Samimi, M. ;Biglari, B. ;Hage-Ali, M. ;Koebel, J. M. ;Siffert, P.


Publisher
John Wiley and Sons
Year
1987
Tongue
English
Weight
481 KB
Volume
100
Category
Article
ISSN
0031-8965

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