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About the origin and the mechanisms involved in the cracking of highly porous silicon layers under capillary stresses

✍ Scribed by O Belmont; C Faivre; D Bellet; Y Brechet

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 797 KB
Volume: 276
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(95)08057-0

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