Ab initio phasing of X-ray powder diffraction patterns by charge flipping
β Scribed by Wu, Jinsong; Leinenweber, Kurt; Spence, John C. H.; O'Keeffe, Michael
- Book ID
- 109933974
- Publisher
- Nature Publishing Group
- Year
- 2006
- Tongue
- English
- Weight
- 573 KB
- Volume
- 5
- Category
- Article
- ISSN
- 1476-1122
- DOI
- 10.1038/nmat1687
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## Abstract Leastβsquare refinement of xβray powder diffraction patterns analyzed by the Rietveld method can yield structural information which had been unattainable or at least elaborate to obtain by conventional pattern analysis. The Rietveld method calculates a powder pattern on the basis of a s