A WIP-based exception-management model for integrated circuit back-end production processes

✍ Scribed by Ruey-Shan Guo; David M. Chiang; Fan-Yun Pai

• Publisher: Springer
• Year: 2006
• Tongue: English
• Weight: 191 KB
• Volume: 33
• Category: Article
• ISSN: 0268-3768
• DOI: 10.1007/s00170-006-0559-6