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A voltage calibration technique of electro-optic probing for characterization internal to IC’s chip

✍ Scribed by Hongfei Liu; Alin Hou; Hongbo Zhang; Daming Zhang; Maobin Yi


Book ID
108210628
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
202 KB
Volume
47
Category
Article
ISSN
0026-2714

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