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A view of the reliability on solid tantalum capacitors : H. Okuda, Y. Negishi and I. Kageyama, NEC Res. Dev. Japan, No. 15, October (1969), p. 56


Publisher
Elsevier Science
Year
1970
Tongue
English
Weight
110 KB
Volume
9
Category
Article
ISSN
0026-2714

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