A Versatile Fail-Safe Trip Circuit for Reactor Safety Systems

✍ Scribed by Trenholme, William M.; Keefe, Donald J.; McDowell, William P.

• Book ID: 117928040
• Publisher: IEEE
• Year: 1966
• Tongue: English
• Weight: 391 KB
• Volume: 13
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1966.4324322