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A universal reliability prediction model for SMD integrated circuits based on field failures

✍ Scribed by G. Kervarrec; M.L. Monfort; A. Riaudel; P.Y. Klimonda; J.R. Coudrin; D. Le Razavet; J.Y. Boulaire; P. Jeanpierre; D. Perie; R. Meister; S. Casassa; J.L. Haumont; B. Liagre

Book ID: 108362428
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 643 KB
Volume: 39
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(99)00099-2

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