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A universal attachment for standard ultrasonic flaw detectors and thickness gages

✍ Scribed by A. N. Astaf’ev; O. V. Nevolin; A. M. Mamai; O. V. Mutyachenko; N. A. Astaf’ev; V. O. Nevolin

Book ID: 110209922
Publisher: SP MAIK Nauka/Interperiodica
Year: 2006
Tongue: English
Weight: 230 KB
Volume: 42
Category: Article
ISSN: 1061-8309
DOI: 10.1134/s1061830906070072

No coin nor oath required. For personal study only.

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