A unified quantum correction model for nanoscale single- and double-gate MOSFETs under inversion conditions

✍ Scribed by Li, Yiming; Yu, Shao-Ming

• Book ID: 120539921
• Publisher: Institute of Physics
• Year: 2004
• Tongue: English
• Weight: 748 KB
• Volume: 15
• Category: Article
• ISSN: 0957-4484
• DOI: 10.1088/0957-4484/15/8/026